Yaosheng Li
Orcid: 0000-0002-5748-7927
According to our database1,
Yaosheng Li
authored at least 3 papers
in 2021.
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Bibliography
2021
General, Efficient, and Real-Time Data Compaction Strategy for APT Forensic Analysis.
IEEE Trans. Inf. Forensics Secur., 2021
On-Line Measurement of Chip Temperature Based on Blocking Leakage Current of the Insulated-Gate Bipolar Transistor Module in the High-Temperature Reverse-Bias Test.
IEEE Access, 2021
Study on Degradation Characteristics of IGBT under Repeated High Transient Electrical Stress.
Proceedings of the EITCE 2021: 5th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, October 22, 2021