Yaoru Hou
Orcid: 0000-0002-2659-966X
According to our database1,
Yaoru Hou
authored at least 3 papers
between 2021 and 2023.
Collaborative distances:
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Bibliography
2023
IEEE Des. Test, June, 2023
A 28nm 2Mb STT-MRAM Computing-in-Memory Macro with a Refined Bit-Cell and 22.4 - 41.5TOPS/W for AI Inference.
Proceedings of the IEEE International Solid- State Circuits Conference, 2023
2021
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2021