Yao Wang

According to our database, Yao Wang authored at least 18 papers between 2011 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

A survey of compute nodes with 100 TFLOPS and beyond for supercomputers.

Junsheng Chang, Kai Lu, Yang Guo, Yongwen Wang, Zhenyu Zhao, Libo Huang, Hongwei Zhou, Yao Wang, Fei Lei, Biwei Zhang

CCF Trans. High Perform. Comput., June, 2024

Hierarchical Mapping of Large-Scale Spiking Convolutional Neural Networks Onto Resource-Constrained Neuromorphic Processor.

Chao Xiao, Xu He, Zhijie Yang, Xun Xiao, Yao Wang, Rui Gong, Junbo Tie, Lei Wang, Weixia Xu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2024

2023

Back to Homogeneous Computing: A Tightly-Coupled Neuromorphic Processor With Neuromorphic ISA.

Zhijie Yang, Lei Wang, Wei Shi, Yao Wang, Junbo Tie, Feng Wang, Xiang Yu, LingHui Peng, Chao Xiao, Xun Xiao, Yao Yao, Gan Zhou, Xuhu Yu, Rui Gong, Xia Zhao, Yuhua Tang, Weixia Xu

IEEE Trans. Parallel Distributed Syst., November, 2023

A General Layout Pattern Clustering Using Geometric Matching-based Clip Relocation and Lower-bound Aided Optimization.

Xu He, Yao Wang, Zhiyong Fu, Yipei Wang, Yang Guo

ACM Trans. Design Autom. Electr. Syst., November, 2023

A Soft-Error Mitigation Approach Using Pulse Quenching Enhancement at Detailed Placement for Combinational Circuits.

Xu He, Yao Wang, Chang Liu, Qiang Wu, Juan Luo, Yang Guo

ACM Trans. Design Autom. Electr. Syst., July, 2023

2022

Dynamic Vision Sensor Based Gesture Recognition Using Liquid State Machine.

Xun Xiao, Lei Wang, Xiaofan Chen, Lianhua Qu, Shasha Guo, Yao Wang, Ziyang Kang

Proceedings of the Artificial Neural Networks and Machine Learning - ICANN 2022, 2022

Accurate timing prediction at placement stage with look-ahead RC network.

Xu He, Zhiyong Fu, Yao Wang, Chang Liu, Yang Guo

Proceedings of the DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10, 2022

2020

Lithography Hotspot Detection with FFT-based Feature Extraction and Imbalanced Learning Rate.

Xu He, Yu Deng, Shizhe Zhou, Rui Li, Yao Wang, Yang Guo

ACM Trans. Design Autom. Electr. Syst., 2020

Maximum Clique Based Method for Optimal Solution of Pattern Classification.

Xu He, Yipei Wang, Zhiyong Fu, Yao Wang, Yang Guo

Proceedings of the 38th IEEE International Conference on Computer Design, 2020

2017

A Mixed-Size Monolithic 3D Placer with 2D Layout Inheritance.

Xu He, Yao Wang, Yang Guo, Sorin Cotofana

Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017

2016

Ripple 2.0: Improved Movement of Cells in Routability-Driven Placement.

Xu He, Yao Wang, Yang Guo, Evangeline F. Y. Young

ACM Trans. Design Autom. Electr. Syst., 2016

2014

Analysis of the impact of spatial and temporal variations on the stability of SRAM arrays and the mitigation technique using independent-gate devices.

Yao Wang, Sorin Dan Cotofana, Liang Fang

J. Parallel Distributed Comput., 2014

A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact.

Honghui Sun, Liang Fang, Yao Wang, Yaqing Chi, Rulin Liu

Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2014

2013

A direct measurement scheme of amalgamated aging effects with novel on-chip sensor.

Nicoleta Cucu Laurenciu, Yao Wang, Sorin Dan Cotofana

Proceedings of the 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, 2013

Lifetime reliability assessment with aging information from low-level sensors.

Yao Wang, Sorin Dan Cotofana, Liang Fang

Proceedings of the Great Lakes Symposium on VLSI 2013 (part of ECRC), 2013

2012

Variation tolerant on-chip degradation sensors for dynamic reliability management systems.

Yao Wang, Marius Enachescu, Sorin Dan Cotofana, Liang Fang

Microelectron. Reliab., 2012

Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices.

Yao Wang, Sorin Dan Cotofana, Liang Fang

Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, 2012

2011

A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits.

Yao Wang, Sorin Cotofana, Liang Fang

Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, 2011