Yanzhou Mu
Orcid: 0000-0003-1816-2246
According to our database1,
Yanzhou Mu
authored at least 9 papers
between 2019 and 2022.
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Bibliography
2022
Can test input selection methods for deep neural network guarantee test diversity? A large-scale empirical study.
Inf. Softw. Technol., 2022
Int. J. Softw. Informatics, 2022
2021
Inf. Softw. Technol., 2021
Proceedings of the 21st IEEE International Conference on Software Quality, 2021
2020
Do different cross-project defect prediction methods identify the same defective modules?
J. Softw. Evol. Process., 2020
IEEE Access, 2020
2019
Proceedings of the International Joint Conference on Neural Networks, 2019