Yannick Guhel

According to our database, Yannick Guhel authored at least 4 papers between 2006 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs.

Sébastien Petitdidier, Fanny Berthet, Yannick Guhel, Jean-Lionel Trolet, Philippe Mary, Christophe Gaquière, Bertrand Boudart

Microelectron. Reliab., 2015

2012

Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence.

Fanny Berthet, Yannick Guhel, Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, Marc Piccione, Christophe Gaquière

Microelectron. Reliab., 2012

2011

Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy.

Fanny Berthet, Yannick Guhel, Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, Marc Piccione, Christophe Gaquière

Microelectron. Reliab., 2011

2006

Comparative studies of Pt and Ir schottky contacts on undoped Al_0.36Ga_0.64N.

Yannick Guhel, Bertrand Boudart, E. Delos, Marianne Germain, Z. Bougrioua

Microelectron. Reliab., 2006