Yang Huang

Orcid: 0000-0002-0403-7826

Affiliations:
  • Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China


According to our database1, Yang Huang authored at least 5 papers between 2018 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Single Event Induced Crosstalk of Monolithic 3D Circuits Based on a 22 nm FD-SOI Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology.
Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

2018
The total ionizing dose response of leading-edge FDSOI MOSFETs.
Microelectron. Reliab., 2018

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.
Microelectron. Reliab., 2018


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