Yang Huang
Orcid: 0000-0002-0403-7826Affiliations:
- Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
According to our database1,
Yang Huang
authored at least 5 papers
between 2018 and 2023.
Collaborative distances:
Collaborative distances:
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Bibliography
2023
The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Single Event Induced Crosstalk of Monolithic 3D Circuits Based on a 22 nm FD-SOI Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology.
Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022
2018
Microelectron. Reliab., 2018
Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.
Microelectron. Reliab., 2018