Yacoub M. El-Ziq

According to our database1, Yacoub M. El-Ziq authored at least 12 papers between 1977 and 1992.

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Bibliography

1992
An ATPG Driver Selection Algorithm for Interconnect Test with Boundary Scan.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990
A Hardware Accelerator for Maze Routing.
IEEE Trans. Computers, 1990

1984
Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design.
Proceedings of the Proceedings International Test Conference 1984, 1984

1983
A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis.
Proceedings of the Proceedings International Test Conference 1983, 1983

1982
Fault Diagnosis of MOS Combinational Networks.
IEEE Trans. Computers, 1982

1981
Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI.
Proceedings of the Proceedings International Test Conference 1981, 1981

Automatic test generation for stuck-open faults in CMOS VLSI.
Proceedings of the 18th Design Automation Conference, 1981

1980
A new test pattern generation system.
Proceedings of the 17th Design Automation Conference, 1980

1979
Testing of MOS combinational networks a procedure for efficient fault simulation and test generation.
Proceedings of the 16th Design Automation Conference, 1979

1978
Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results.
IEEE Trans. Computers, 1978

Logic design automation of MOS combinational networks with fan-in, fan-out constraints.
Proceedings of the 15th Design Automation Conference, 1978

1977
Logic design automation of diagnosable MOS combinational logic networks.
Proceedings of the 14th Design Automation Conference, 1977


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