Yachen Kong
Orcid: 0000-0002-0782-9765
According to our database1,
Yachen Kong
authored at least 3 papers
between 2020 and 2022.
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Bibliography
2022
Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
2021
Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT Security.
Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021
2020
Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020