Ya Shun Wang
Orcid: 0000-0001-6766-6139
According to our database1,
Ya Shun Wang
authored at least 3 papers
between 2014 and 2017.
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Bibliography
2017
Optimal Design of Step-stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures.
Qual. Reliab. Eng. Int., 2017
2015
Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing.
Reliab. Eng. Syst. Saf., 2015
2014
Statistical Inference of Accelerated Life Testing With Dependent Competing Failures Based on Copula Theory.
IEEE Trans. Reliab., 2014