Ya Shun Wang

Orcid: 0000-0001-6766-6139

According to our database1, Ya Shun Wang authored at least 3 papers between 2014 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2017
Optimal Design of Step-stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures.
Qual. Reliab. Eng. Int., 2017

2015
Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing.
Reliab. Eng. Syst. Saf., 2015

2014
Statistical Inference of Accelerated Life Testing With Dependent Competing Failures Based on Copula Theory.
IEEE Trans. Reliab., 2014


  Loading...