Y. Y. Hsieh

According to our database, Y. Y. Hsieh authored at least 1 paper in 2007.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2007

Effect of oval defects in GaAs on the reliability of SiN_x metal-insulator-metal capacitors.

P. J. van der Wel, J. R. de Beer, R. J. M. van Boxtel, Y. Y. Hsieh, Y. C. Wang

Microelectron. Reliab., 2007