Y. Segui

According to our database, Y. Segui authored at least 3 papers between 2006 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.

Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana

Microelectron. Reliab., 2008

Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.

A. Belarni, Mohamed Lamhamdi, Patrick Pons, Laurent Boudou, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana

Microelectron. Reliab., 2008

2006

Charging-Effects in RF capacitive switches influence of insulating layers composition.

Mohamed Lamhamdi, Jean Guastavino, Laurent Boudou, Y. Segui, Patrick Pons, Laurent Bouscayrol, Robert Plana

Microelectron. Reliab., 2006