Y. S. Yip

According to our database, Y. S. Yip authored at least 1 paper in 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2004

Full ball shear metrology as defect detection and analysis tool for solder joint reliability assessment on direct immersion gold technology.

C. K. Chen, W. A. Tan, H. S. Goh, Y. S. Yip, W. T. Saw

Microelectron. Reliab., 2004