Y. S. Tsai
According to our database1,
Y. S. Tsai
authored at least 8 papers
between 1998 and 2018.
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Bibliography
2018
Fast chip aging prediction by product-like VMIN drift characterization on test structures.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2011
Acta Informatica, 2011
2010
2006
2004
1998