Y. Jeong

According to our database, Y. Jeong authored at least 5 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND.

D. Tiernc, Antonio Arreghini, Alicja Lesniewska, Y. Jeong, Marleen H. van der Veen, J. Stiers, N. Bazzazian, Ivan Ciofi, Geert Van den Bosch, Maarten Rosmeulen

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance.

Yusuke Higashi, J. P. Bastos, Adrian Vaisman Chasin, Laurent Breuil, Antonio Arreghini, S. Ramesh, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Pure-Metal Replacement Gate for Reliable 30 nm Pitch Scaled 3D NAND Flash.

S. Rachidi, S. Ramesh, Davide Tierno, G. L. Donadio, A. Pacco, J. W. Maes, Y. Jeong, Antonio Arreghini, Geert Van den Bosch, Maarten Rosmeulen

Proceedings of the IEEE International Memory Workshop, 2024

2014

Secure multiple-input single-output communication - Part II: δ-secrecy symbol error probability and secrecy diversity.

T. V. Nguyen, Y. Jeong, J. S. Kwak, H. Shin

IET Commun., 2014

Secure multiple-input single-output communication - Part I: secrecy rates and switched power allocation.

T. V. Nguyen, Y. Jeong, J. S. Kwak, H. Shin

IET Commun., 2014