Xuerong Ye

According to our database, Xuerong Ye authored at least 21 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Life prediction of lithium thionyl chloride batteries based on the pulse load test and accelerated degradation test.

Xuerong Ye, Qisen Sun, Wenwen Li, Guofu Zhai

Qual. Reliab. Eng. Int., December, 2023

Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range.

Cen Chen, Chengzhi Sun, Liqin Wu, Xuerong Ye, Guofu Zhai

Qual. Reliab. Eng. Int., December, 2023

Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate.

Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye, Guofu Zhai

IEEE Trans. Reliab., March, 2023

2022

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process.

Bokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio

Reliab. Eng. Syst. Saf., 2022

A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling.

Xuerong Ye, Yifan Hu, Bokai Zheng, Cen Chen, Guofu Zhai

Reliab. Eng. Syst. Saf., 2022

2021

An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis.

Xuerong Ye, Yifan Hu, Junxian Shen, Cen Chen, Guofu Zhai

IEEE Trans. Instrum. Meas., 2021

Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator.

Xuerong Ye, Hao Chen, Cen Chen, Guofu Zhai

IEEE Trans. Ind. Electron., 2021

A failure mechanism consistency test method for accelerated degradation test.

Guofu Zhai, Bokai Zheng, Xuerong Ye, Shuang Si, Enrico Zio

Qual. Reliab. Eng. Int., 2021

Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary.

Cen Chen, Yun Yang, Xuerong Ye, Guofu Zhai

IEEE Access, 2021

An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation.

Yun Yang, Cen Chen, Xuerong Ye, Chengzhi Sun

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2021

2020

An Improved Empirical Mode Decomposition Based on Adaptive Weighted Rational Quartic Spline for Rolling Bearing Fault Diagnosis.

Xuerong Ye, Yifan Hu, Junxian Shen, Rui Feng, Guofu Zhai

IEEE Access, 2020

2018

The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress.

Xuerong Ye, Kaixin Zhang, Cen Chen, Zhongwei Li, Yue Wang, Guofu Zhai

Microelectron. Reliab., 2018

Manufacturing process-based storage degradation modelling and reliability assessment.

Xuerong Ye, Yigang Lin, Qingmin Wang, Hao Niu, Guofu Zhai

Microelectron. Reliab., 2018

Fault localization of a switched mode power supply based on extended integer-coded dictionary method.

Xuerong Ye, Cen Chen, Guofu Zhai

Microelectron. Reliab., 2018

VDMOSFET HEF degradation modelling considering turn-around phenomenon.

Xuerong Ye, Cen Chen, Yixing Wang, L. Wang, Guofu Zhai

Microelectron. Reliab., 2018

Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts.

Hao Niu, Shujuan Wang, Xuerong Ye, Huai Wang, Frede Blaabjerg

Microelectron. Reliab., 2018

A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests.

Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht

IEEE Access, 2018

2015

A Tolerance Design Method for Electronic Circuits Based on Performance Degradation.

Guofu Zhai, Yuege Zhou, Xuerong Ye

Qual. Reliab. Eng. Int., 2015

2011

Failure Process and Dynamic Reliability Estimation of Sealed Relay.

Xuerong Ye, Jie Deng, Qiong Yu, Guofu Zhai

IEICE Trans. Electron., 2011

2009

Research on Dynamic Characteristics Testing and Analyzing System of Electromagnetic Relay.

Xuerong Ye, Huimin Liang, Jie Deng, Guofu Zhai

IEICE Trans. Electron., 2009

2006

Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability Index.

Huimin Liang, Xuerong Ye, Guofu Zhai

IEICE Trans. Electron., 2006