Xuepeng Zhan

According to our database, Xuepeng Zhan authored at least 18 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Operation Scheme Optimizations to Achieve Ultra-high Endurance (1010) in Flash Memory with Robust Reliabilities.

Yang Feng, Zhaohui Sun, Chengcheng Wang, Xinyi Guo, Junyao Mei, Yueran Qi, Jing Liu, Junyu Zhang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen

CoRR, 2024

2023

Near-threshold-voltage operation in flash-based high-precision computing-in-memory to implement Poisson image editing.

Yang Feng, Bing Chen, Mingfeng Tang, Yuerang Qi, Maoying Bai, Chengcheng Wang, Hai Wang, Xuepeng Zhan, Junyu Zhang, Jing Liu, Jixuan Wu, Jiezhi Chen

Sci. China Inf. Sci., December, 2023

High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage.

Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

Dual-pulse disturb-free programming scheme for FeFET based neuromorphic computing.

Shuhao Wu, Bo Chen, Chengcheng Wang, Junyao Mei, Maoying Bai, Xuepeng Zhan, Jixuan Wu, Junshuai Chai, Hao Xu, Xiaolei Wang, Jiezhi Chen

Microelectron. J., 2023

Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme.

Xiaohuan Zhao, Shaoqi Yang, Kenie Xie, Yang Feng, Qianwen Wang, Pengpeng Sang, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen

Proceedings of the IEEE International Conference on Integrated Circuits, 2023

Opto-Electronic Monolayer ZnO Memristor Produced via Low Temperature Atomic Layer Deposition.

Junyao Mei, Bo Chen, Pengpeng Sang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen

Proceedings of the IEEE International Conference on Integrated Circuits, 2023

Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD.

Zhichao Du, Chuanxue Sun, Xiaoyu Dou, Pengpeng Sang, Xuepeng Zhan, Chengji Jin, Jixuan Wu, Jiezhi Chen

Proceedings of the IEEE International Conference on Integrated Circuits, 2023

One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash.

Shaoqi Yang, Xiaohuan Zhao, Kenie Xie, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen

Proceedings of the 15th IEEE International Conference on ASIC, 2023

Flash-based Computing-in-memory Architectures with High-accuracy and Robust Reliabilities for General-purpose Applications.

Yang Feng, Yueran Qi, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen

Proceedings of the 15th IEEE International Conference on ASIC, 2023

2022

Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory.

Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang, Fei Wu, Jiezhi Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Voltage and temperature dependence of Random Telegraph Noise and their impacts on random number generator.

Mingtao Xu, Bo Chen, Qi Jin, Lu Tai, Xuepeng Zhan, Jiezhi Chen

Microelectron. J., 2022

Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors.

Xuepeng Zhan, Jiezhi Chen, Zhigang Ji

Sci. China Inf. Sci., 2022

Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash.

Kenie Xie, Pena Guo, Fei Chen, Binglu Chen, Xiaotong Fang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen

Proceedings of the 2022 IEEE International Conference on Integrated Circuits, 2022

Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage.

Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen

Proceedings of the International Conference on Compilers, 2022

2021

Flash memory based computing-in-memory system to solve partial differential equations.

Yang Feng, Fei Wang, Xuepeng Zhan, Yuan Li, Jiezhi Chen

Sci. China Inf. Sci., 2021

Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT Security.

Yifang Xi, Xiaotong Fang, Yachen Kong, Yifan Guo, Hongzhe Lin, Xuepeng Zhan, Jiezhi Chen

Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021

2020

Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions.

Yachen Kong, Meng Zhang, Xuepeng Zhan, Rui Cao, Jiezhi Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Dual-Point Technique for Multi-Trap RTN Signal Extraction.

Xuepeng Zhan, Yifang Xi, Qianwen Wang, Weiqiang Zhang, Zhigang Ji, Jiezhi Chen

IEEE Access, 2020