Xuanyi Tan
Orcid: 0009-0009-0599-8539Timeline
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Bibliography
2024
ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects.
Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD, 2024
Proceedings of the IEEE International Test Conference, 2024