Xuanwu Kang

According to our database, Xuanwu Kang authored at least 3 papers between 2011 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop.

Denis Marcon, John Viaene, Paola Favia, Hugo Bender, Xuanwu Kang, Silvia Lenci, Steve Stoffels, Stefaan Decoutere

Microelectron. Reliab., 2012

High temperature behaviour of GaN-on-Si high power MISHEMT devices.

Dirk Wellekens, Rafael Venegas, Xuanwu Kang, Mohammed Zahid, Tian-Li Wu, Denis Marcon, Puneet Srivastava, Marleen Van Hove, Stefaan Decoutere

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2011

GaN-based HEMTs tested under high temperature storage test.

Denis Marcon, Xuanwu Kang, John Viaene, Marleen Van Hove, Puneet Srivastava, Stefaan Decoutere, Robert Mertens, Gustaaf Borghs

Microelectron. Reliab., 2011