Xu-Hao Jiang

According to our database, Xu-Hao Jiang authored at least 2 papers between 2019 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling.

Leon Li-Yang Chen, Katherine Shu-Min Li, Xu-Hao Jiang, Sying-Jyan Wang, Andrew Yi-Ann Huang, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu

Proceedings of the IEEE International Test Conference, 2021

2019

TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning.

Andrew Yi-Ann Huang, Katherine Shu-Min Li, Cheng-Yen Tsai, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Xu-Hao Jiang, Leon Chou, Chen-Shiun Lee

Proceedings of the IEEE International Test Conference, 2019