Xingwen Li
Orcid: 0000-0001-6823-3335
According to our database1,
Xingwen Li
authored at least 18 papers
between 2005 and 2023.
Collaborative distances:
Collaborative distances:
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Bibliography
2023
2022
Feature Selection and Detection Method of Weak Arc Faults in Photovoltaic Systems With Strong Noises Based on Stochastic Resonance.
IEEE Trans. Instrum. Meas., 2022
2020
Effect of Varying Threshold Voltage on Efficiency of CMOS Rectifiers for Piezoelectric Energy Harvesting Applications.
Proceedings of the IEEE Canadian Conference on Electrical and Computer Engineering, 2020
2012
Environmentally-Friendly Switches: Arcing Phenomena in Vacuum and SF<sub>6</sub> Substitutes.
IEICE Trans. Electron., 2012
2011
Experimental Study of the Arc Plasma Characteristics in SF<sub>6</sub>, N<sub>2</sub> and CO<sub>2</sub>.
IEICE Trans. Electron., 2011
2010
A Method to Predict the Spring Parameters of the Adjustable Magnetic Release for Molded Case Circuit Breakers.
IEICE Trans. Electron., 2010
IEICE Trans. Electron., 2010
Effect of Different Vent Configurations on the Interruption Performance of Arc Chamber.
IEICE Trans. Electron., 2010
2008
IEICE Trans. Electron., 2008
Thermal Analysis of AC Contactor Using Thermal Network Finite Difference Analysis Method.
IEICE Trans. Electron., 2008
IEICE Trans. Electron., 2008
IEICE Trans. Electron., 2008
2007
Analysis and Research on Electro-Dynamic Repulsion Force Acting on the Paralleled Conductors in Air Circuit Breaker.
IEICE Trans. Electron., 2007
Study of the Effect of Gassing Material on Arc Behavior in Low Voltage Circuit Breaker.
IEICE Trans. Electron., 2007
2006
Investigation on the Interruption Process of Molded Case Circuit Breakers Including the Influence of Blow Open Force.
IEICE Trans. Electron., 2006
Experimental Investigation on the Arc Motion with Different Configurations of Quenching Chamber in AC Contactor.
IEICE Trans. Electron., 2006
2005
Investigation on the Dynamic Characteristics of a Magnetic Release in Molded Case Circuit Breaker.
IEICE Trans. Electron., 2005
IEICE Trans. Electron., 2005