Xinggong Wan

According to our database, Xinggong Wan authored at least 2 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET.

Ri-an Zhao, Matthew Koskinen, Yang Liu, Xinggong Wan

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2014

A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28 nm node.

Xinggong Wan, Sandhya Chandrashekhar, Boris Bayha, Martin Trentzsch, Torben Balzer, Mahesh Siddabathula, Oliver Aubel

Microelectron. Reliab., 2014