Xin Huang

According to our database, Xin Huang authored at least 21 papers between 2013 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Dynamic electromigration modeling for transient stress evolution and recovery under time-dependent current and temperature stressing.

Xin Huang, Valeriy Sukharev, Taeyoung Kim, Sheldon X.-D. Tan

Integr., 2017

2016

Physics-Based Electromigration and Time Dependent Dielectric Breakdown Modeling and Reliability Analysis for Nanometer VLSI Circuits

Xin Huang

PhD thesis, 2016

Physics-Based Electromigration Models and Full-Chip Assessment for Power Grid Networks.

Xin Huang, Armen Kteyan, Sheldon X.-D. Tan, Valeriy Sukharev

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Analytical Modeling and Characterization of Electromigration Effects for Multibranch Interconnect Trees.

Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Taeyoung Kim, Valeriy Sukharev

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Electromigration assessment for power grid networks considering temperature and thermal stress effects.

Xin Huang, Valeriy Sukharev, Jun-Ho Choy, Marko Chew, Taeyoung Kim, Sheldon X.-D. Tan

Integr., 2016

EM-Based On-Chip Aging Sensor for Detection of Recycled ICs.

Kai He, Xin Huang, Sheldon X.-D. Tan

IEEE Des. Test, 2016

Voltage-based electromigration immortality check for general multi-branch interconnects.

Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

Learning-based dynamic reliability management for dark silicon processor considering EM effects.

Taeyoung Kim, Xin Huang, Hai-Bao Chen, Valeriy Sukharev, Sheldon X.-D. Tan

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Physics-based full-chip TDDB assessment for BEOL interconnects.

Xin Huang, Valeriy Sukharev, Zhongdong Qi, Taeyoung Kim, Sheldon X.-D. Tan

Proceedings of the 53rd Annual Design Automation Conference, 2016

Electromigration recovery modeling and analysis under time-dependent current and temperature stressing.

Xin Huang, Valeriy Sukharev, Taeyoung Kim, Hai-Bao Chen, Sheldon X.-D. Tan

Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

2015

Task Migrations for Distributed Thermal Management Considering Transient Effects.

Zao Liu, Sheldon X.-D. Tan, Xin Huang, Hai Wang

IEEE Trans. Very Large Scale Integr. Syst., 2015

<i>H</i>-Matrix-Based Finite-Element-Based Thermal Analysis for 3D ICs.

Hai-Bao Chen, Ying-Chi Li, Sheldon X.-D. Tan, Xin Huang, Hai Wang, Ngai Wong

ACM Trans. Design Autom. Electr. Syst., 2015

H²-matrix-based finite element linear solver for fast transient thermal analysis of high-performance ICs.

Hai-Bao Chen, Sheldon X.-D. Tan, David H. Shin, Xin Huang, Hai Wang, Guoyong Shi

Int. J. Circuit Theory Appl., 2015

EM-Based on-Chip Aging Sensor for Detection and Prevention of Counterfeit and Recycled ICs.

Kai He, Xin Huang, Sheldon X.-D. Tan

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

Interconnect reliability modeling and analysis for multi-branch interconnect trees.

Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim

Proceedings of the 52nd Annual Design Automation Conference, 2015

New electromigration modeling and analysis considering time-varying temperature and current densities.

Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Valeriy Sukharev

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

Direct finite-element-based solver for 3D-IC thermal analysis via H-matrix representation.

Ying-Chi Li, Sheldon X.-D. Tan, Tan Yu, Xin Huang, Ngai Wong

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

IR-drop based electromigration assessment: parametric failure chip-scale analysis.

Valeriy Sukharev, Xin Huang, Hai-Bao Chen, Sheldon X.-D. Tan

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

Accurate full-chip estimation of power map, current densities and temperature for EM assessment.

Marko Chew, Ara Aslyan, Jun-Ho Choy, Xin Huang

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

Physics-based Electromigration Assessment for Power Grid Networks.

Xin Huang, Tan Yu, Valeriy Sukharev, Sheldon X.-D. Tan

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

2013

Distributed task migration for thermal hot spot reduction in many-core microprocessors.

Zao Liu, Xin Huang, Sheldon X.-D. Tan, Hai Wang, He Tang

Proceedings of the IEEE 10th International Conference on ASIC, 2013