Xiaoxin Fan

According to our database, Xiaoxin Fan authored at least 11 papers between 2007 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

C-Testing and Efficient Fault Localization for AI Accelerators.

Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2020

C-Testing of AI Accelerators ^*.

Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2013

Distributed dynamic partitioning based diagnosis of scan chain.

Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2012

Improved volume diagnosis throughput using dynamic design partitioning.

Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware

Proceedings of the 2012 IEEE International Test Conference, 2012

Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns.

Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, Sudhakar M. Reddy

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Genetic algorithm based approach for segmented testing.

Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato

Proceedings of the IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), 2011

Max-Fill: A method to generate high quality delay tests.

Xiaoxin Fan, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

On Using Design Partitioning to Reduce Diagnosis Memory Footprint.

Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2008

Localized random access scan: Towards low area and routing overhead.

Yu Hu, Xiang Fu, Xiaoxin Fan, Hideo Fujiwara

Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008

2007

The design-for-testability features of a general purpose microprocessor.

Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li

Proceedings of the 2007 IEEE International Test Conference, 2007

An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing.

Xiaoxin Fan, Yu Hu, Laung-Terng Wang

Proceedings of the 16th Asian Test Symposium, 2007