Xiaoxiao Wang
Orcid: 0000-0001-7943-8360Affiliations:
- Beihang University, Beijing, China
According to our database1,
Xiaoxiao Wang
authored at least 27 papers
between 2008 and 2020.
Collaborative distances:
Collaborative distances:
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on orcid.org
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Bibliography
2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
2019
IEEE Trans. Very Large Scale Integr. Syst., 2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
2018
An On-Chip Dynamically Obfuscated Wrapper for Protecting Supply Chain Against IP and IC Piracies.
IEEE Trans. Very Large Scale Integr. Syst., 2018
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018
Proceedings of the 17th IEEE International Conference On Trust, 2018
Proceedings of the 27th IEEE Asian Test Symposium, 2018
2017
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017
Dynamically obfuscated scan for protecting IPs against scan-based attacks throughout supply chain.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
Proceedings of the 18th International Workshop on Microprocessor and SOC Test and Verification, 2017
Proceedings of the 2017 Asian Hardware Oriented Security and Trust Symposium, 2017
2016
A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Enhancing noise sensitivity of embedded SRAMs for robust true random number generation in SoCs.
Proceedings of the 2016 IEEE Asian Hardware-Oriented Security and Trust, 2016
2015
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20, 2015
2014
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
2012
Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements.
IEEE Trans. Very Large Scale Integr. Syst., 2012
Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements.
Proceedings of the 2012 IEEE International Test Conference, 2012
2010
Proceedings of the Design, Automation and Test in Europe, 2010
2009
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
Proceedings of the 2008 International Conference on Computer-Aided Design, 2008
Power supply signal calibration techniques for improving detection resolution to hardware Trojans.
Proceedings of the 2008 International Conference on Computer-Aided Design, 2008
Proceedings of the IEEE International Workshop on Hardware-Oriented Security and Trust, 2008
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis.
Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008