Xiaoxian Liu
Orcid: 0000-0002-1798-7572
According to our database1,
Xiaoxian Liu
authored at least 26 papers
between 2013 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2024
An Evaluation of Ecosystem Quality and Its Response to Aridity on the Qinghai-Tibet Plateau.
Remote. Sens., September, 2024
2023
A Resonant Magnetic Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Field Components.
IEEE Trans. Circuits Syst. II Express Briefs, December, 2023
Microelectron. J., March, 2023
A Composite Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Fields.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2023
Substrate-Integrated Waveguide Band-Pass Filter and Diplexer With Controllable Transmission Zeros and Wide-Stopband.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2023
Microelectron. J., 2023
2022
Microelectron. J., 2022
2021
IEEE Trans. Very Large Scale Integr. Syst., 2021
Microelectron. J., 2021
2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
IEEE Trans. Circuits Syst., 2020
Microelectron. J., 2020
2019
Electromagnetic modeling and analysis of the tapered differential through glass vias.
Microelectron. J., 2019
Microelectron. J., 2019
2018
Temperature-dependent characterizations on parasitic capacitance of tapered through silicon via (T-TSV).
IEICE Electron. Express, 2018
Inductance of Different Profiles of Through Glass Vias based on magnetic flux density.
Proceedings of the 2018 IEEE Asia Pacific Conference on Circuits and Systems, 2018
2014
Microelectron. J., 2014
Temperature properties of the parasitic resistance of through-silicon vias (TSVs) in high-frequency 3-D ICs.
IEICE Electron. Express, 2014
Proceedings of the 2014 IEEE Geoscience and Remote Sensing Symposium, 2014
2013
Thermo-mechanical performance of Cu and SiO<sub>2</sub> filled coaxial through-silicon-via (TSV).
IEICE Electron. Express, 2013
Analytical models for the thermal strain and stress induced by annular through-silicon-via (TSV).
IEICE Electron. Express, 2013
Reduction of signal reflection in high-frequency three-dimensional (3D) integration circuits.
IEICE Electron. Express, 2013
Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol 10 (2013) No 19 pp 20130588].
IEICE Electron. Express, 2013
IEICE Electron. Express, 2013
An Automatic Parallel-Stage Decoupled Software Pipelining Parallelization Algorithm Based on OpenMP.
Proceedings of the 12th IEEE International Conference on Trust, 2013
A Compile-Time Cost Model for Automatic OpenMP Decoupled Software Pipelining Parallelization.
Proceedings of the 14th ACIS International Conference on Software Engineering, 2013