Xiaorong Duan
According to our database1,
Xiaorong Duan
authored at least 3 papers
between 2001 and 2021.
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Bibliography
2021
Proceedings of the ICCIR 2021: International Conference on Control and Intelligent Robotics, 2021
2002
Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction.
Microelectron. Reliab., 2002
2001
A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under V<sub>g</sub>=V<sub>d</sub>.
Microelectron. Reliab., 2001