Xiaoling Lin

According to our database, Xiaoling Lin authored at least 9 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Knowledge transferring framework for cell library characterization.

Zhengguang Tang, Cong Li, Guangxin Guo, Mingyu Ma, Hailong You, Xiaoling Lin

Microelectron. J., 2025

2024

Reversible and Irreversible Polarization Degradation of Hf0.5Zr0.5O2 Capacitors with Coherent Structural Transition at Elevated Temperatures.

Zhaomeng Gao, Tianjiao Xin, Cheng Liu, Yilin Xu, Yiwei Wang, Yunzhe Zheng, Rui Wang, Xiaotian Li, Yonghui Zheng, Kai Du, Diqing Su, Zhaohao Zhang, Huaxiang Yin, Weifeng Zhang, Chao Li, Xiaoling Lin, Haitao Jiang, Sannian Song, Zhitang Song, Yan Cheng, Hangbing Lyu

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

A Machine Learning Mapping Algorithm for NoC Optimization.

Weng Xiaodong, Yi Liu, Changqing Xu, Xiaoling Lin, Linjun Zhan, Shunyao Wang, Dongdong Chen, Yintang Yang

Symmetry, February, 2023

2022

Optimization Strategy of Regular NoC Mapping Using Genetic-Based Hyper-Heuristic Algorithm.

Changqing Xu, Jiahao Ning, Yi Liu, Mintao Luo, Dongdong Chen, Xiaoling Lin, Yintang Yang

Symmetry, 2022

A high-performance processor for optimal ate pairing computation over Barreto-Naehrig curves.

Yujun Xie, Bin Wang, Lijun Zhang, Xin Zheng, Xiaoling Lin, Xiaoming Xiong, Yuan Liu

IET Circuits Devices Syst., 2022

A Deep Learning Approach Using Graph Neural Networks for Anomaly Detection in Air Quality Data Considering Spatiotemporal Correlations.

Xiaoling Lin, Hongzhang Wang, Jing Guo, Gang Mei

IEEE Access, 2022

2021

The study of parameters variation of nMOSFET affected by the HCI.

Xiaowen Zhang, Xiaoling Lin, Rui Gao

Proceedings of the 14th IEEE International Conference on ASIC, 2021

2020

A 28-GHz 16-Gb/s High Efficiency 16-QAM Transmitter in 65-nm CMOS.

Xiangyu Meng, Milad Kalantari, Baoyong Chi, Wenhua Chen, Zhijian Chen, Xiaoling Lin, C. Patrick Yue

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.

Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020