Xiaole Zhao
Orcid: 0000-0003-0100-2414
According to our database1,
Xiaole Zhao
authored at least 24 papers
between 2011 and 2025.
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Bibliography
2025
segWCD: A new segmentation-based weak supervision neural network for building change detection.
Appl. Intell., January, 2025
Assisted diagnosis of neuropsychiatric disorders based on functional connectivity: A survey on application and performance evaluation of graph neural network.
Expert Syst. Appl., 2025
2024
IEEE Trans. Neural Networks Learn. Syst., May, 2024
Efficient Single Image Super-Resolution with Entropy Attention and Receptive Field Augmentation.
Proceedings of the 32nd ACM International Conference on Multimedia, MM 2024, Melbourne, VIC, Australia, 28 October 2024, 2024
Proceedings of the International Joint Conference on Neural Networks, 2024
2023
Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023
Proceedings of the 34th British Machine Vision Conference 2023, 2023
2022
IEEE Trans. Circuits Syst. Video Technol., 2022
Knowl. Based Syst., 2022
2021
Pyramid Orthogonal Attention Network based on Dual Self-Similarity for Accurate Mr Image Super-Resolution.
Proceedings of the 2021 IEEE International Conference on Multimedia and Expo, 2021
Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, 2021
2020
Gibbs-ringing artifact suppression with knowledge transfer from natural images to MR images.
Multim. Tools Appl., 2020
Int. J. Neural Syst., 2020
Comput. Vis. Image Underst., 2020
2019
IEEE Trans. Image Process., 2019
FC<sup>2</sup>N: Fully Channel-Concatenated Network for Single Image Super-Resolution.
CoRR, 2019
CoRR, 2019
2018
Proceedings of the Pattern Recognition and Computer Vision - First Chinese Conference, 2018
2016
Neurocomputing, 2016
Single image super-resolution via blind blurring estimation and anchored space mapping.
Comput. Vis. Media, 2016
2011
Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview.
Microelectron. Reliab., 2011