Xiao Liu

According to our database, Xiao Liu authored at least 21 papers between 2008 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Trace-Based Post-Silicon Validation for VLSI Circuits

Xiao Liu, Qiang Xu

Lecture Notes in Electrical Engineering 252, Springer, ISBN: 978-3-319-00532-4, 2014

2013

On Multiplexed Signal Tracing for Post-Silicon Validation.

Xiao Liu, Qiang Xu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

2012

On X-Variable Filling and Flipping for Capture-Power Reduction in Linear Decompressor-Based Test Compression Environment.

Xiao Liu, Qiang Xu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

On Signal Selection for Visibility Enhancement in Trace-Based Post-Silicon Validation.

Xiao Liu, Qiang Xu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

On efficient silicon debug with flexible trace interconnection fabric.

Xiao Liu, Qiang Xu

Proceedings of the 2012 IEEE International Test Conference, 2012

X-tracer: a reconfigurable X-tolerant trace compressor for silicon debug.

Feng Yuan, Xiao Liu, Qiang Xu

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2011

Capture-power-aware test data compression using selective encoding.

Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu

Integr., 2011

Pseudo-functional testing for small delay defects considering power supply noise effects.

Feng Yuan, Xiao Liu, Qiang Xu

Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

On High-Quality Test Pattern Selection and Manipulation.

Feng Yuan, Xiao Liu, Qiang Xu

Proceedings of the 16th European Test Symposium, 2011

On multiplexed signal tracing for post-silicon debug.

Xiao Liu, Qiang Xu

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Layout-aware pseudo-functional testing for critical paths considering power supply noise effects.

Xiao Liu, Yubin Zhang, Feng Yuan, Qiang Xu

Proceedings of the Design, Automation and Test in Europe, 2010

On Signal Tracing for Debugging Speedpath-Related Electrical Errors in Post-Silicon Validation.

Xiao Liu, Qiang Xu

Proceedings of the 19th IEEE Asian Test Symposium, 2010

On signal tracing in post-silicon validation.

Qiang Xu, Xiao Liu

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009

Trace signal selection for debugging electrical errors in post-silicon validation.

Xiao Liu, Qiang Xu

Proceedings of the 2009 IEEE International Test Conference, 2009

On simultaneous shift- and capture-power reduction in linear decompressor-based test compression environment.

Xiao Liu, Qiang Xu

Proceedings of the 2009 IEEE International Test Conference, 2009

A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment.

Xiao Liu, Qiang Xu

Proceedings of the Design, Automation and Test in Europe, 2009

Trace signal selection for visibility enhancement in post-silicon validation.

Xiao Liu, Qiang Xu

Proceedings of the Design, Automation and Test in Europe, 2009

Interconnection fabric design for tracing signals in post-silicon validation.

Xiao Liu, Qiang Xu

Proceedings of the 46th Design Automation Conference, 2009

2008

A Generic Framework for Scan Capture Power Reduction in Test Compression Environment.

Xiao Liu, Feng Yuan, Qiang Xu

Proceedings of the 2008 IEEE International Test Conference, 2008

On capture power-aware test data compression for scan-based testing.

Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu

Proceedings of the 2008 International Conference on Computer-Aided Design, 2008

On Reusing Test Access Mechanisms for Debug Data Transfer in SoC Post-Silicon Validation.

Xiao Liu, Qiang Xu

Proceedings of the 17th IEEE Asian Test Symposium, 2008