Xiankun Jin

According to our database, Xiankun Jin authored at least 8 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning.

Ayush Arunachalam, Ian Kintz, Suvadeep Banerjee, Arnab Raha, Xiankun Jin, Fei Su, Viswanathan Pillai Prasanth, Rubin A. Parekhji, Suriyaprakash Natarajan, Kanad Basu

CoRR, 2024

2023

Innovation Practices Track: Silicon Lifecycle Management Challenges and Opportunities.

Fei Su, Xiankun Robert Jin, Nilanjan Mukherjee, Yervant Zorian

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits.

Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu

Proceedings of the IEEE International Test Conference, 2023

2022

Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing.

Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity

Proceedings of the IEEE International Test Conference, 2022

2021

Fast Gate Leakage Current Monitor With Large Dynamic Range.

Kushagra Bhatheja, Xiankun Jin, Matthew R. Strong, Degang Chen

IEEE Trans. Circuits Syst. II Express Briefs, 2021

2018

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test.

Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen

IEEE Trans. Circuits Syst. I Regul. Pap., 2018

2017

An on-chip ADC BIST solution and the BIST enabled calibration scheme.

Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen

Proceedings of the IEEE International Test Conference, 2017

2014

Low-cost high-quality constant offset injection for SEIR-based ADC built-in-self-test.

Xiankun Jin, Nan Sun

Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014