Xiangdong Xuan
According to our database1,
Xiangdong Xuan
authored at least 4 papers
between 2001 and 2006.
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Bibliography
2006
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects.
J. Electron. Test., 2006
2004
Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits.
Proceedings of the 9th European Test Symposium, 2004
2003
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003
2001
Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001