Xiangchao Zhang
Orcid: 0000-0003-3809-1262
According to our database1,
Xiangchao Zhang
authored at least 7 papers
between 2008 and 2024.
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Bibliography
2024
Balancing the Efficiency and Sensitivity of Defect Inspection of Non-Patterned Wafers with TDI-Based Dark-Field Scattering Microscopy.
Sensors, March, 2024
2023
Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy.
Sensors, December, 2023
A General Reconstruction Framework for Deflectometric Measurement Based on Nonuniform B-Splines.
IEEE Trans. Instrum. Meas., 2023
2021
Adaptive Phase Correction for Phase Measuring Deflectometry Based on Light Field Modulation.
IEEE Trans. Instrum. Meas., 2021
Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level.
Sensors, 2021
2020
Structure Design and Image Reconstruction of Hexagonal-Array Photonics Integrated Interference Imaging System.
IEEE Access, 2020
2008
Numerical analyses of the boundary effect of radial basis functions in 3D surface reconstruction.
Numer. Algorithms, 2008