Xian Wang
Affiliations:- Georgia Institute of Technology, Atlanta, GA, USA
According to our database1,
Xian Wang
authored at least 15 papers
between 2012 and 2017.
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Bibliography
2017
Self-Learning RF Receiver Systems: Process Aware Real-Time Adaptation to Channel Conditions for Low Power Operation.
IEEE Trans. Circuits Syst. I Regul. Pap., 2017
2016
Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016
2015
Real-Time Use-Aware Adaptive RF Transceiver Systems for Energy Efficiency Under BER Constraints.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware.
J. Electron. Test., 2015
Low cost high frequency signal synthesis: Application to RF channel interference testing.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
"Safe" built-in test and tuning of boost converters using feedback loop perturbations.
Proceedings of the 16th Latin-American Test Symposium, 2015
2014
J. Electron. Test., 2014
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Proceedings of the 2014 International Test Conference, 2014
Self-learning MIMO-RF receiver systems: process resilient real-time adaptation to channel conditions for low power operation.
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014
2013
Built-In Test of Switched-Mode Power Converters: Avoiding DUT Damage Using Alternative Safe Measurements.
Proceedings of the 22nd Asian Test Symposium, 2013
Proceedings of the 22nd Asian Test Symposium, 2013
2012
Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters.
Proceedings of the 2012 IEEE International Test Conference, 2012