Xhesila Xhafa
Orcid: 0000-0001-8951-7580
According to our database1,
Xhesila Xhafa
authored at least 5 papers
between 2021 and 2024.
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Bibliography
2024
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024
A Structural Testing Approach for SRAM Address Decoders Using Cell-Aware Methodology.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024
2023
Proceedings of the IEEE European Test Symposium, 2023
Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies.
Proceedings of the IEEE European Test Symposium, 2023
2021
An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors.
IEEE Trans. Instrum. Meas., 2021