Xavier Jordà
Orcid: 0000-0003-1967-610X
According to our database1,
Xavier Jordà
authored at least 34 papers
between 1992 and 2024.
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Bibliography
2024
Measurement Uncertainty in Fourier Coefficient- Based Time Series Reconstruction Considering Calibration Effects in Thermal Imaging.
IEEE Trans. Instrum. Meas., 2024
2023
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics.
IEEE Trans. Instrum. Meas., 2023
2021
IEEE Trans. Ind. Electron., 2021
2019
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging.
IEEE Trans. Instrum. Meas., 2019
Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices.
IEEE Trans. Ind. Electron., 2019
2017
IEEE Trans. Ind. Electron., 2017
2015
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging.
IEEE Trans. Ind. Electron., 2015
IEEE Trans. Ind. Electron., 2015
Microelectron. J., 2015
2014
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications.
Microelectron. Reliab., 2014
Microelectron. Reliab., 2014
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectron. J., 2014
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2013
Microelectron. Reliab., 2013
High temperature-low temperature coefficient analog voltage reference integrated circuit implemented with SiC MESFETs.
Proceedings of the ESSCIRC 2013, 2013
2012
Microelectron. Reliab., 2012
Microelectron. Reliab., 2012
Microelectron. Reliab., 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
2011
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions.
IEEE Trans. Ind. Electron., 2011
IEEE Trans. Ind. Electron., 2011
IEEE Trans. Ind. Electron., 2011
2008
Microelectron. Reliab., 2008
2007
Microelectron. Reliab., 2007
Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles.
Microelectron. Reliab., 2007
2004
Microelectron. J., 2004
IGBT gate driver IC with full-bridge output stage using a modified standard CMOS process.
Microelectron. J., 2004
2001
Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001
1992
Telematic Services in Catalan Schools: Working Environment and Achievements.
Proceedings of the Education and Society, 1992