Woohyun Chung
Orcid: 0000-0002-1541-0745
According to our database1,
Woohyun Chung
authored at least 9 papers
between 2015 and 2024.
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Bibliography
2024
IEEE Trans. Instrum. Meas., 2024
Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty.
IEEE Access, 2024
2019
ACM Trans. Design Autom. Electr. Syst., 2019
2017
IEEE Trans. Very Large Scale Integr. Syst., 2017
2016
Proceedings of the International Conference on IC Design and Technology, 2016
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
Proceedings of the 53rd Annual Design Automation Conference, 2016
2015
Defect Probability of Directed Self-Assembly Lithography: Fast Identification and Post-Placement Optimization.
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015
Identifying redundant inter-cell margins and its application to reducing routing congestion.
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015