Wolfgang Wilkening

According to our database, Wolfgang Wilkening authored at least 8 papers between 2001 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Functional analysis of an integrated communication interface during ESD.

Thomas Ungru, Wolfgang Wilkening, Steffen Walker, Renato Negra

Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

2013

EMC immunity of integrated smart power transistors in a non-50Ω environment.

Hermann Nzalli, Wolfgang Wilkening, Rolf H. Jansen

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2007

Verification of CDM circuit simulation using an ESD evaluation circuit.

M. Etherton, J. Willemen, Wolfgang Wilkening, Ning Qu, S. Mettler, Wolfgang Fichtner

Microelectron. Reliab., 2007

2006

Study of CDM specific effects for a smart power input protection structure.

M. Etherton, Ning Qu, J. Willemen, Wolfgang Wilkening, S. Mettler, Mariano Dissegna, R. Stella, L. Zullino, A. Andreini, Horst A. Gieser

Microelectron. Reliab., 2006

2005

Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain.

Heinrich Wolf, Horst A. Gieser, Wolfgang Stadler, Wolfgang Wilkening

Microelectron. Reliab., 2005

Test circuits for fast and reliable assessment of CDM robustness of I/O stages.

Wolfgang Stadler, Kai Esmark, K. Reynders, M. Zubeidat, Michael Graf, Wolfgang Wilkening, J. Willemen, Ning Qu, S. Mettler, M. Etherton

Microelectron. Reliab., 2005

2003

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini

Microelectron. Reliab., 2003

2001

Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation.

Michael Schenkel, Paul Pfäffli, Wolfgang Wilkening, D. Aemmer, Wolfgang Fichtner

Microelectron. Reliab., 2001