Wolfgang Stadler

According to our database, Wolfgang Stadler authored at least 16 papers between 1993 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Editorial ESD reliability special section.

Vesselin K. Vassilev, Wolfgang Stadler

Microelectron. Reliab., 2009

Do ESD fails in systems correlate with IC ESD robustness?

Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner

Microelectron. Reliab., 2009

Reliability aspects of gate oxide under ESD pulse stress.

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix

Microelectron. Reliab., 2009

Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.

Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler

Microelectron. Reliab., 2009

CDM tests on interface test chips for the verification of ESD protection concepts.

Tilo Brodbeck, Kai Esmark, Wolfgang Stadler

Microelectron. Reliab., 2009

2007

Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.

Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler

Microelectron. Reliab., 2007

2006

Physical fundamentals of external transient latch-up and corrective actions.

Krzysztof Domanski, B. Póltorak, S. Bargstädt-Franke, Wolfgang Stadler, Waclaw Bala

Microelectron. Reliab., 2006

2005

Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain.

Heinrich Wolf, Horst A. Gieser, Wolfgang Stadler, Wolfgang Wilkening

Microelectron. Reliab., 2005

High abstraction level permutational ESD concept analysis.

Martin Streibl, Franz Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel

Microelectron. Reliab., 2005

Test circuits for fast and reliable assessment of CDM robustness of I/O stages.

Wolfgang Stadler, Kai Esmark, K. Reynders, M. Zubeidat, Michael Graf, Wolfgang Wilkening, J. Willemen, Ning Qu, S. Mettler, M. Etherton

Microelectron. Reliab., 2005

Guest editorial.

Wolfgang Stadler

Microelectron. Reliab., 2005

Transient latch-up: experimental analysis and device simulation.

S. Bargstädt-Franke, Wolfgang Stadler, Kai Esmark, Martin Streibl, Krzysztof Domanski, Horst A. Gieser, Heinrich Wolf, Waclaw Bala

Microelectron. Reliab., 2005

2003

Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.

Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner

Microelectron. Reliab., 2003

2002

Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.

Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik

Microelectron. Reliab., 2002

2001

Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase.

Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner

Microelectron. Reliab., 2001

1993

Einführung verteilter Systeme in einem Unternehmen der Markenartikelindustrie - Organisatorische Konsequenzen.

Wolfgang Stadler

Proceedings of the Verteilte Systeme, 1993