Wolfgang Gös

This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.

Bibliography

2024
Field-Free Perpendicular Magnetization Switching of SOT-MRAM Devices by Magnetic Spin Hall Effect.
Proceedings of the 47th MIPRO ICT and Electronics Convention, 2024

Influence of Interface Exchange Coupling in Multilayered Spintronic Structures.
Proceedings of the 47th MIPRO ICT and Electronics Convention, 2024

Advancing Nonvolatile Memory Technologies: Enhancing Reliability and Performance through Double Spin Torque Magnetic Tunnel Junctions and Interlayer Exchange Coupling.
Proceedings of the Device Research Conference, 2024

2023
Back-Hopping in Ultra-Scaled MRAM Cells.
Proceedings of the 46th MIPRO ICT and Electronics Convention, 2023

Towards Efficient SOT-Assisted STT-MRAM Cell Switching Using Reinforcement Learning.
Proceedings of the Large-Scale Scientific Computations - 14th International Conference, 2023

Comprehensive Modeling of Advanced Composite Magnetoresistive Devices.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022
Spin Transfer Torques in Ultra-Scaled MRAM Cells.
Proceedings of the 45th Jubilee International Convention on Information, 2022

Spin Torques in ULTRA-Scaled MRAM Devices.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021
Finite Element Method Approach to MRAM Modeling.
Proceedings of the 44th International Convention on Information, 2021

A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification.
Proceedings of the IEEE International Memory Workshop, 2021

2020
On the impact of mechanical stress on gate oxide trapping.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM.
Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018
Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.
Microelectron. Reliab., 2018

2015
Characterization and modeling of reliability issues in nanoscale devices.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

On the volatility of oxide defects: Activation, deactivation, and transformation.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

The defect-centric perspective of device and circuit reliability - From individual defects to circuits.
Proceedings of the 45th European Solid State Device Research Conference, 2015

2014
Characterization and modeling of charge trapping: From single defects to devices.
Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

2009
Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.
Microelectron. Reliab., 2009

2008
The effect of uniaxial stress on band structure and electron mobility of silicon.
Math. Comput. Simul., 2008

2007
VSP - A gate stack analyzer.
Microelectron. Reliab., 2007


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