Wim Dobbelaere

According to our database, Wim Dobbelaere authored at least 25 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.

Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2023

2022

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2020

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations.

Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

ACM Trans. Design Autom. Electr. Syst., 2020

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.

Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2020

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics.

Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2020

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing.

Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2020

2019

Innovative Practices on Automotive Test.

Wim Dobbelaere, Marco Restifo, Peter Sarson

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.

Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2019

2018

An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes.

Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren

IEEE Des. Test, 2018

ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.

Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren

IEEE Des. Test, 2018

Innovative practices on quality levels of A/MS devices.

Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems.

Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2017

Non-intrusive detection of defects in mixed-signal integrated circuits using light activation.

Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2017

Automatic testing of analog ICs for latent defects using topology modification.

Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Proceedings of the 22nd IEEE European Test Symposium, 2017

A very low cost and highly parallel DfT method for analog and mixed-signal circuits.

Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization.

Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Integr., 2016

Effective DC fault models and testing approach for open defects in analog circuits.

Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren

Proceedings of the 2016 IEEE International Test Conference, 2016

Analog fault coverage improvement using final-test dynamic part average testing.

Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen

Proceedings of the 2016 IEEE International Test Conference, 2016

Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis.

Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Automated testing of mixed-signal integrated circuits by topology modification.

Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Automatic generation of autonomous built-in observability structures for analog circuits.

Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

Design and test of analog circuits towards sub-ppm level.

Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen

Proceedings of the 2014 International Test Conference, 2014

Optimization of analog fault coverage by exploiting defect-specific masking.

Anthony Coyette, Georges G. E. Gielen, Ronny Vanhooren, Wim Dobbelaere

Proceedings of the 19th IEEE European Test Symposium, 2014