William V. Huott

According to our database, William V. Huott authored at least 19 papers between 1997 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2019

Case Study of Advanced Diagnostic Techniques for Multi Port Register File.

Uma Srinivasan, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert

Proceedings of the 28th IEEE North Atlantic Test Workshop, 2019

2018

IBM z14™: 14nm microprocessor for the next-generation mainframe.

Christopher J. Berry, James D. Warnock, John Isakson, John Badar, Brian Bell, Frank Malgioglio, Guenter Mayer, Dina Hamid, Jesse Surprise, David Wolpert, Ofer Geva, Bill Huott, Leon J. Sigal, Sean M. Carey, Richard F. Rizzolo, Ricardo Nigaglioni, Mark Cichanowski, Dureseti Chidambarrao, Christian Jacobi, Anthony Saporito, Arthur O'neill, Robert J. Sonnelitter, Christian G. Zoellin, Michael H. Wood, José Neves

Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

2012

Circuit and Physical Design Implementation of the Microprocessor Chip for the zEnterprise System.

James D. Warnock, Yiu-Hing Chan, Sean M. Carey, Huajun Wen, Patrick J. Meaney, Guenter Gerwig, Howard H. Smith, Yuen H. Chan, John Davis, Paul Bunce, Antonio Pelella, Daniel Rodko, Pradip Patel, Thomas Strach, Doug Malone, Frank Malgioglio, José Neves, David L. Rude, William V. Huott

IEEE J. Solid State Circuits, 2012

2011

A 5.2GHz microprocessor chip for the IBM zEnterprise™ system.

James D. Warnock, Y. Chan, William V. Huott, Sean M. Carey, Michael F. Fee, Huajun Wen, Mary Jo Saccamango, Frank Malgioglio, Patrick J. Meaney, Donald W. Plass, Yuen H. Chan, Mark D. Mayo, Guenter Mayer, Leon J. Sigal, David L. Rude, Robert M. Averill III, Michael H. Wood, Thomas Strach, Howard H. Smith, Brian W. Curran, Eric M. Schwarz, Lee Eisen, Doug Malone, Steve Weitzel, Pak-kin Mak, Thomas J. McPherson, Charles F. Webb

Proceedings of the IEEE International Solid-State Circuits Conference, 2011

2010

Testing the IBM Power 7™ 4 GHz eight core microprocessor.

James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh

Proceedings of the 2011 IEEE International Test Conference, 2010

2008

On-chip Timing Uncertainty Measurements on IBM Microprocessors.

Robert L. Franch, Phillip J. Restle, James K. Norman, William V. Huott, Joshua Friedrich, R. Dixon, Steve Weitzel, K. van Goor, Gerard Salem

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Comparison of Split-Versus Connected-Core Supplies in the POWER6 Microprocessor.

Norman K. James, Phillip J. Restle, Joshua Friedrich, Bill Huott, Bradley D. McCredie

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

Design of the Power6 Microprocessor.

Joshua Friedrich, Bradley D. McCredie, Norman K. James, Bill Huott, Brian W. Curran, Eric Fluhr, Gaurav Mittal, Eddie Chan, Yuen H. Chan, Donald W. Plass, Sam G. Chu, Hung Q. Le, Leo Clark, John R. Ripley, Scott A. Taylor, Jack DiLullo, Mary Yvonne Lanzerotti

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

2006

A 5.6GHz 64kB Dual-Read Data Cache for the POWER6TM Processor.

John Davis, Don Plass, Paul Bunce, Yuen H. Chan, Antonio Pelella, Rajiv V. Joshi, A. Chen, William V. Huott, Thomas J. Knips, Pradip Patel, K. Lo, Eric Fluhr

Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

2005

An advanced optical diagnostic technique of IBM z990 eServer microprocessor.

Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003

Diagnosis in Modern Design to Volume - The Tip of the Iceberg.

William V. Huott

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2001

99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.

Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).

William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia N. Sanda, Steven C. Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Testing the 500-MHz IBM S/390 Microprocessor.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins

IEEE Des. Test Comput., 1998

Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.

Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

A 4.1-ns compact 54×54-b multiplier utilizing sign-select Booth encoders.

Charles F. Webb, Carl J. Anderson, Leon J. Sigal, Kenneth L. Shepard, John S. Liptay, James D. Warnock, Brian W. Curran, Barry Krumm, Mark D. Mayo, Peter J. Camporese, Eric M. Schwarz, Mark S. Farrell, Phillip J. Restle, Robert M. Averill III, Timothy J. Slegel, William V. Huott, Yuen H. Chan, Bruce Wile, Thao N. Nguyen, Philip G. Emma, Daniel K. Beece, Ching-Te Chuang, Cyril Price

IEEE J. Solid State Circuits, 1997

Circuit design techniques for the high-performance CMOS IBM S/390 Parallel Enterprise Server G4 microprocessor.

Leon J. Sigal, James D. Warnock, Brian W. Curran, Yuen H. Chan, Peter J. Camporese, Mark D. Mayo, William V. Huott, Daniel R. Knebel, Ching-Te Chuang, James P. Eckhardt, Philip T. Wu

IBM J. Res. Dev., 1997

Advanced microprocessor test strategy and methodology.

William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen

IBM J. Res. Dev., 1997

Testing the 400-MHz IBM Generation-4 CMOS Chip.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997