William R. Eisenstadt

According to our database, William R. Eisenstadt authored at least 43 papers between 1986 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2022

Special Session on RF/5G Test.

William R. Eisenstadt, Mark Roos, Devin Morris, José Luis González-Jiménez, Christopery Mounet, Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière

Proceedings of the IEEE European Test Symposium, 2022

2021

MicroSTARLING: A Millimeter Scale Self-Organizing Optical Communication Processor for Embedded Multihop Sensor and Computational Networks.

Lee J. Johnson, William R. Eisenstadt, Frank Alexander, Kyle T. Packer

IEEE Access, 2021

Design for Testability of Low Dropout Regulators.

Anurag Tulsiram, William R. Eisenstadt

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Signal Integrity in High Speed 3D IC Design- A Case Study.

Shadi M. Harb, William R. Eisenstadt

Proceedings of the IEEE Nordic Circuits and Systems Conference, NorCAS 2021, Oslo, 2021

2017

Guest Editorial: Analog, Mixed-Signal and RF Testing.

Manuel J. Barragán, William R. Eisenstadt

J. Electron. Test., 2017

A study of characterizing crosstalk effects in 3-D vias.

Shadi M. Harb, William R. Eisenstadt

Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017

2016

Oscillation ring testing methodology of TSVs in 3D stacked ICs.

Shadi M. Harb, William R. Eisenstadt

Proceedings of the IEEE Nordic Circuits and Systems Conference, 2016

2015

A CMOS High Resolution Multi-Edge Delay Generator.

Shadi M. Harb, William R. Eisenstadt

Proceedings of the Nordic Circuits and Systems Conference, 2015

Design and techniques for on-die power integrity noise measurement system with digital output.

Hyunho Baek, William R. Eisenstadt

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2013

Embedded RF Test Circuits: RF Power Detectors, RF Power Control Circuits, Directional Couplers, and 77-GHz Six-Port Reflectometer.

William R. Eisenstadt, Byul Hur

J. Inform. and Commun. Convergence Engineering, 2013

2011

A sub-1V CMOS voltage reference generator.

Shadi M. Harb, William R. Eisenstadt, Robert M. Fox

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

2010

Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude.

Devin Morris, William R. Eisenstadt, Andrea Paganini, Mustapha Slamani, Timothy Platt, John Ferrario

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

High speed I/O and thermal effect characterization of 3D stacked ICs.

Moishe Groger, Shadi M. Harb, Devin Morris, William R. Eisenstadt, Sudeep Puligundla

Proceedings of the IEEE International Conference on 3D System Integration, 2009

2008

Wireless System for Microwave Test Signal Generation.

Qizhang Yin, William R. Eisenstadt, Tian Xia

IEEE Des. Test Comput., 2008

High speed digital CMOS divide-by-N fequency divider.

Saleh Abdel-Hafeez, Shadi M. Harb, William R. Eisenstadt

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

2007

A low-power CAM using a 12-transistor design cell.

Saleh Abdel-Hafeez, Shadi M. Harb, William R. Eisenstadt

Proceedings of the IFIP VLSI-SoC 2007, 2007

Low-Power Content Addressable Memory With Read/Write and Matched Mask Ports.

Saleh Abdel-Hafeez, Shadi M. Harb, William R. Eisenstadt

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2007

Embedded Jitter Measurement of High-speed I/O Signals.

Xueqing Wang, William R. Eisenstadt, Robert M. Fox

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

2006

SPICE-based mixed-mode S-parameter calculations for four-port and three-port circuits.

Kooho Jung, William R. Eisenstadt, Robert M. Fox

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Bipolar Microwave RMS Power Detectors.

Tao Zhang, William R. Eisenstadt, Robert M. Fox, Qizhang Yin

IEEE J. Solid State Circuits, 2006

2005

Embedded loopback test for RF ICs.

Jangsup Yoon, William R. Eisenstadt

IEEE Trans. Instrum. Meas., 2005

A translinear RMS detector for embedded test of RF ICs.

Qizhang Yin, William R. Eisenstadt, Robert M. Fox, Tao Zhang

IEEE Trans. Instrum. Meas., 2005

On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).

Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects.

Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

IEEE Trans. Very Large Scale Integr. Syst., 2004

Differential log-domain filters with high-gain common-mode feedback.

Robert M. Fox, H. J. Ko, William R. Eisenstadt

IEEE Trans. Circuits Syst. I Regul. Pap., 2004

A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching.

Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching.

Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004

A novel 5GHz RF power detector.

Tao Zhang, William R. Eisenstadt, Robert M. Fox

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Lumped passive circuits for 5GHz embedded test of RF SoCs.

Jangsup Yoon, William R. Eisenstadt

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

A translinear-based RF RMS detector for embedded test.

Qizhang Yin, Robert M. Fox, William R. Eisenstadt

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

Improving Wireless Product Testing via University and Industry Collaboration.

William R. Eisenstadt

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Design of programmable embedded IF source for design self-test.

Sanghoon Choi, William R. Eisenstadt, Robert M. Fox

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

2002

Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system.

Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines.

Yungseon Eo, Jongin Shim, William R. Eisenstadt

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

Circuit for monitoring BJT RF performance using DC measurements.

Robert M. Fox, R. Chawla, William R. Eisenstadt, D. Hemmenway, J. Johnston

IEEE J. Solid State Circuits, 2002

Wireless Test.

Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects.

Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

Proceedings of the Fourth IEEE/ACM International Workshop on System-Level Interconnect Prediction (SLIP 2002), 2002

2001

Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects.

Woojin Jin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

IEEE Trans. Very Large Scale Integr. Syst., 2001

High-gain common-mode feedback circuits for differential log-domain filters.

Robert M. Fox, Hyung-Jong Ko, William R. Eisenstadt

Proceedings of the 2001 International Symposium on Circuits and Systems, 2001

2000

LINC power amplifier combiner method efficiency optimization.

Bob Stengel, William R. Eisenstadt

IEEE Trans. Veh. Technol., 2000

1999

New 1.4 volt transconductor with superior power supply rejection.

Y. Ro, William R. Eisenstadt, Robert M. Fox

Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999

1987

A Special Function Unit for Database Operations Within a Data-Control Flow System.

Herman Lam, Stanley Y. W. Su, F. L. C. Seeger, William R. Eisenstadt

Proceedings of the International Conference on Parallel Processing, 1987

1986

SPICE Simulation of SOI MOSFET Integrated Circuits.

Surya Veeraraghavan, Jerry G. Fossum, William R. Eisenstadt

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986