Will Howell

According to our database, Will Howell authored at least 2 papers between 2018 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Defect-Oriented Test: Effectiveness in High Volume Manufacturing.

Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2018

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.

Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski

Proceedings of the IEEE International Test Conference, 2018