Wilfried Redemund

According to our database, Wilfried Redemund authored at least 6 papers between 2010 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.

Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski

Proceedings of the IEEE International Test Conference, 2018

2014

Cell-Aware Test.

Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Cell-aware experiences in a high-quality automotive test suite.

Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski

Proceedings of the 19th IEEE European Test Symposium, 2014

2012

Cell-aware Production test results from a 32-nm notebook processor.

Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Cell-aware analysis for small-delay effects and production test results from different fault models.

Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

Defect-oriented cell-internal testing.

Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger

Proceedings of the 2011 IEEE International Test Conference, 2010