Wilfred John

According to our database, Wilfred John authored at least 1 paper in 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2014

Effect of gate trench fabrication technology on reliability of AlGaN/GaN heterojunction field effect transistors.

Sergey A. Chevtchenko, Matthias Schulz, Eldad Bahat-Treidel, Wilfred John, Stephan Freyer, Paul Kurpas, Joachim Würfl

Microelectron. Reliab., 2014