Wieslaw Kuzmicz
Orcid: 0000-0001-5201-2503
According to our database1,
Wieslaw Kuzmicz
authored at least 26 papers
between 1986 and 2019.
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Bibliography
2019
Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019
2017
Proceedings of the 24th International Conference Mixed Design of Integrated Circuits and Systems, 2017
Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017
2016
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016
2014
Artif. Intell. Medicine, 2014
2013
Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013
2011
Proceedings of the 14th Euromicro Conference on Digital System Design, 2011
2008
Proceedings of the 11th Euromicro Conference on Digital System Design: Architectures, 2008
2007
Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2007
2005
Proceedings of the 10th European Test Symposium, 2005
Proceedings of the Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August, 2005
2004
2002
Microelectron. Reliab., 2002
Proceedings of the 2002 Euromicro Symposium on Digital Systems Design (DSD 2002), 2002
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002
2001
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement.
Microelectron. Reliab., 2001
Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001
2000
Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000
Proceedings of the 5th European Test Workshop, 2000
Graphical user interface of FIESTA - software for faults identification and estimation of testability of VLSI circuits.
Proceedings of the Symposium on Contemporary Computing in Ukraine, 2000
1997
Extension of Inductive Fault Analysis to Parametric Faults in Analog Circuits with Application to Test Generation.
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997
1996
IEEE Trans. Fuzzy Syst., 1996
1995
Proceedings of the 1995 European Design and Test Conference, 1995
1986
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986