Wey Jean Tee

According to our database, Wey Jean Tee authored at least 1 paper in 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers.

Melanie Po-Leen Ooi, Chris Chan, Wey Jean Tee, Ye Chow Kuang, Lindsay Kleeman, Serge N. Demidenko

Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010