Werner Kanert

According to our database¹, Werner Kanert authored at least 10 papers between 2003 and 2014.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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PhD thesis

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On csauthors.net:

Bibliography

2014

Robustness Validation - A physics of failure based approach to qualification.

[BibT_eX]

[DOI]

Werner Kanert

Microelectron. Reliab., 2014

2012

Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2012

Active cycling reliability of power devices: Expectations and limitations.

[BibT_eX]

[DOI]

Werner Kanert

Microelectron. Reliab., 2012

2011

Quality assurance in automotive electronics.

[BibT_eX]

[DOI]

Elektrotech. Informationstechnik, 2011

2008

Reduction of test effort. Looking for more acceleration for reliable components for automotive applications.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2008

2007

Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

2006

ESD protection structure qualification - a new approach for release for automotive applications.

[BibT_eX]

[DOI]

Michael Goroll

Werner Kanert

Reinhard Pufall

Microelectron. Reliab., 2006

2004

Semiconductors in high temperature applications - a future trend in automotive industry.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

2003

Reliability aspects of semiconductor devices in high temperature applications.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2003

Werner Kanert

Timeline

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Links

On csauthors.net:

Bibliography

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