Werner Frammelsberger
Orcid: 0000-0002-4253-222X
According to our database1,
Werner Frammelsberger
authored at least 7 papers
between 2003 and 2017.
Collaborative distances:
Collaborative distances:
Timeline
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Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
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on orcid.org
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Bibliography
2017
Microelectron. Reliab., 2017
2007
Influence of the manufacturing process on the electrical properties of thin (k stacks observed with CAFM.
Microelectron. Reliab., 2007
2006
Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures.
Microelectron. Reliab., 2006
2005
Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling.
Microelectron. Reliab., 2005
2004
Microelectron. Reliab., 2004
AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis.
Microelectron. Reliab., 2004
2003
Characterization of thin and ultra-thin SiO<sub>2</sub> films and SiO<sub>2</sub>/Si interfaces with combined conducting and topographic atomic force microscopy.
Microelectron. Reliab., 2003