Wenlan Jiang

Orcid: 0000-0002-4724-2088

According to our database1, Wenlan Jiang authored at least 2 papers in 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2021
Virtual Metrology for Semiconductor Chemical Mechanical Planarization Process Using Wide & Deep Learning.
Proceedings of the ICCPR '21: 10th International Conference on Computing and Pattern Recognition, Shanghai, China, October 15, 2021

Phase Partition Based Virtual Metrology for Material Removal Rate Prediction in Chemical Mechanical Planarization Process.
Proceedings of the Artificial Intelligence - First CAAI International Conference, 2021


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